1. Böcker
  2. Teknisk litteratur
  3. X-Ray Scattering from Semiconductors and Other Materials Paul F Fewster

X-Ray Scattering from Semiconductors and Other Materials Paul F Fewster

X-Ray Scattering from Semiconductors and Other Materials Paul F Fewster
Författare(r)
Språk
Publiceringsår
Sidor
493
ISBN
978-981-4436-92-2
 
Utgått
Maila mig när tillgängligt Spara till önskelista
This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included. This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.
This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included. This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.
EAN
9789814436922
Bibliotekskategori BIC:
TB
Liknande produkter
  • Schuster Tara
    Publiceringsår: 2023
    Inbunden, hårda pärmar
    32.00 €
    29.09 € utan Moms
  • Wiedeman Reeves
    Publiceringsår: 2024
    Inbunden, hårda pärmar
    28.00 €
    25.45 € utan Moms
  • Carroll Lewis
    Publiceringsår: 2024
    Inbunden, hårda pärmar
    48.00 €
    43.64 € utan Moms
  • Rowling Joanne Kathleen
    Publiceringsår: 2024
    Inbunden, kartonnerad
    48.00 €
    43.64 € utan Moms
  • Plokhij Sergej Nikolaevich
    Publiceringsår: 2024
    Inbunden, hårda pärmar
    30.00 €
    27.27 € utan Moms
  • Rowling Joanne Kathleen
    Publiceringsår: 2024
    Inbunden, kartonnerad
    48.00 €
    43.64 € utan Moms
  • Judt Tony
    Publiceringsår: 2024
    Inbunden, hårda pärmar
    40.00 €
    36.36 € utan Moms
  • Stone Brad
    Publiceringsår: 2024
    Inbunden, hårda pärmar
    37.00 €
    33.64 € utan Moms
  • Gardner Dan
    Publiceringsår: 2024
    Inbunden, hårda pärmar
    32.00 €
    29.09 € utan Moms
  • Odintsova Irina Vladimirovna
    Publiceringsår: 2024
    Häftad, mjuka pärmar
    35.00 €
    31.82 € utan Moms